基于性能退化的印制板电连接器的贮存寿命评估  

Evaluation of Storage Life of PCB Connectors Based on Performance Degradation

作　　者：马震 钱萍[1] 刘鑫雨 王哲 姚华军 

机构地区：[1]浙江理工大学浙江省机电产品可靠性技术研究重点实验室,浙江 杭州 [2]北京控制与电子技术研究所,北京 [3]杭州航天电子技术有限公司,浙江 杭州

出　　处：《建模与仿真》2023年第2期1160-1170,共11页Modeling and Simulation

摘　　要：针对贮存环境下某型号印制板电连接器的可靠性评估问题,分析了其在贮存环境下的失效机理,并基于接触对表面氧化膜层的增长规律,建立了接触对的性能退化轨迹模型;以温度作为加速因子,制定了恒定应力加速退化试验方案并开展试验;通过退化模型估计出每个试验样品的伪寿命,然后利用Anderson-Darling统计确定了其寿命分布为对数正态分布,并对各个温度应力下寿命分布函数的未知参数进行了极大似然估计,最后利用最小二乘法并结合阿伦尼斯加速方程,得到了该型号电连接器的在贮存环境下的可靠寿命,为其它同类型号电连接器的可靠度评估提供了理论依据。Aiming at the reliability evaluation problem of a type of printed circuit board electrical connector in storage environment, the failure mechanism of the connector in storage environment was analyzed, and the performance degradation trajectory model of the contact pair was established based on the growth law of the oxide film on the surface of the contact pair. Taking temperature as the accelera-tion factor, the constant stress accelerated degradation test scheme was formulated and carried out. Then the median rank method and Anderson-Darling statistics were used to determine the lognormal distribution of the life distribution function, and the unknown parameters of the life dis-tribution function under each temperature stress were estimated by maximum likelihood. Finally, through the least square method combined with the Arenis acceleration equation, the reliable life of this type of electrical connector in storage environment is obtained, which provides a theoretical basis for the reliability evaluation of other similar types of electrical connectors.

关 键 词：电连接器 贮存环境 极大似然估计 寿命分布函数 最小二乘法 对数正态分布 可靠度评估 试验样品 

分 类 号：TM5[电气工程—电器]