System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code  

作　　者：J. Robert Theivadas V. Ranganathan J. Raja Paul Perinbam J. Robert Theivadas;V. Ranganathan;J. Raja Paul Perinbam(Department of ECE Research Scholar, Anna University, Chennai, India;Department of ECE, Vignan University, Guntur, India;Department of ECE, KCG College of Technology, Chennai, India)

机构地区：[1]Department of ECE Research Scholar, Anna University, Chennai, India [2]Department of ECE, Vignan University, Guntur, India [3]Department of ECE, KCG College of Technology, Chennai, India

出　　处：《Circuits and Systems》2016年第8期1213-1223,共11页电路与系统（英文）

摘　　要：System-on-a-chips with intellectual property cores need a large volume of data for testing. The large volume of test data requires a large testing time and test data memory. Therefore new techniques are needed to optimize the test data volume, decrease the testing time, and conquer the ATE memory limitation for SOC designs. This paper presents a new compression method of testing for intellectual property core-based system-on-chip. The proposed method is based on new split- data variable length (SDV) codes that are designed using the split-options along with identification bits in a string of test data. This paper analyses the reduction of test data volume, testing time, run time, size of memory required in ATE and improvement of compression ratio. Experimental results for ISCAS 85 and ISCAS 89 Benchmark circuits show that SDV codes outperform other compression methods with the best compression ratio for test data compression. The decompression architecture for SDV codes is also presented for decoding the implementations of compressed bits. The proposed scheme shows that SDV codes are accessible to any of the variations in the input test data stream.System-on-a-chips with intellectual property cores need a large volume of data for testing. The large volume of test data requires a large testing time and test data memory. Therefore new techniques are needed to optimize the test data volume, decrease the testing time, and conquer the ATE memory limitation for SOC designs. This paper presents a new compression method of testing for intellectual property core-based system-on-chip. The proposed method is based on new split- data variable length (SDV) codes that are designed using the split-options along with identification bits in a string of test data. This paper analyses the reduction of test data volume, testing time, run time, size of memory required in ATE and improvement of compression ratio. Experimental results for ISCAS 85 and ISCAS 89 Benchmark circuits show that SDV codes outperform other compression methods with the best compression ratio for test data compression. The decompression architecture for SDV codes is also presented for decoding the implementations of compressed bits. The proposed scheme shows that SDV codes are accessible to any of the variations in the input test data stream.

关 键 词：Test Data Compression SDV Codes SOC ATE Benchmark Circuits 

分 类 号：TN9[电子电信—信息与通信工程]