Structural Morphological and Dielectric Properties of Pb1-xNixTiO3 Doped with Ni  

作　　者：A. Tawfik O.M. Hemeda D.M. Hemeda R. Shady M. Barakat A. Tawfik;O.M. Hemeda;D.M. Hemeda;R. Shady;M. Barakat(Faculty of Science Physics Department, Tanta University, Tanta, Egypt;Oklat Al-Skoor Fac. of Science & Arts Physics Department, Qassim University, Qassim, Saudi Arabia)

机构地区：[1]Faculty of Science Physics Department, Tanta University, Tanta, Egypt [2]Oklat Al-Skoor Fac. of Science & Arts Physics Department, Qassim University, Qassim, Saudi Arabia

出　　处：《Open Journal of Applied Sciences》2016年第11期796-813,共19页应用科学（英文）

摘　　要：In this paper, we have reported a conformable PbTiO3 ceramics doped with Ni by standard double sintering technique as well as chemical co-precipitation method which were successfully synthesized by means of carefully controlled processing parameters. Single phase formation was confirmed through X-Ray Diffraction (XRD) analysis, IR spectroscopy, SEM micrograph and TEM images. Discussion and comparison between both preparation methods were made on the basis of observed results. The tetragonality c/a decreased from 1.049 to 1.0276 for ceramic samples and decreased from 1.06519 to 1.0365 for co-precipitation samples by increasing Ni content. TEM images show small ferroelectric domains of about 3 to 14 nm for the co-precipitation sample and 26 to 48 nm for the ceramic samples. The SEM of co- precipitation samples shows that the microstructure is very dense. The behavior of ε identifies that our samples are nonrelaxor. Increasing the Ni concentration increases the value of dielectric constant and the Tc is shifted to lower temperature.In this paper, we have reported a conformable PbTiO3 ceramics doped with Ni by standard double sintering technique as well as chemical co-precipitation method which were successfully synthesized by means of carefully controlled processing parameters. Single phase formation was confirmed through X-Ray Diffraction (XRD) analysis, IR spectroscopy, SEM micrograph and TEM images. Discussion and comparison between both preparation methods were made on the basis of observed results. The tetragonality c/a decreased from 1.049 to 1.0276 for ceramic samples and decreased from 1.06519 to 1.0365 for co-precipitation samples by increasing Ni content. TEM images show small ferroelectric domains of about 3 to 14 nm for the co-precipitation sample and 26 to 48 nm for the ceramic samples. The SEM of co- precipitation samples shows that the microstructure is very dense. The behavior of ε identifies that our samples are nonrelaxor. Increasing the Ni concentration increases the value of dielectric constant and the Tc is shifted to lower temperature.

关 键 词：Lead Titanate Co-Precipitation Method Dielectric Constant Transmission Electron Microscope 

分 类 号：TQ1[化学工程]