Study on Backward Scattering Characteristics of Submicron Particles  

作　　者：Keliang Hou Chunwei Wang Xiang Liu 

机构地区：[1]College of Science, University of Shanghai for Science and Technology, Shanghai, China

出　　处：《Optics and Photonics Journal》2020年第5期79-87,共9页光学与光子学期刊（英文）

摘　　要：In production and scientific research, the research on the characteristics of submicron particles has attracted extensive attention, which is of great significance to the development of industrial production, medical and health inspection and other fields. In this paper, the characteristics of submicron particles are studied based on backlight scattering. By collecting the real-time waveform of the backscattering signal of particles with different particle sizes at different concentrations, the corresponding relationship between the particle concentration and the number of pulses was obtained. It is found that the peak value of the backscattered light energy has a good linear relationship with the particle size. The analysis of the signal distribution law of standard particle swarm with different particle size parameters found that it conformed to the lognormal distribution form.In production and scientific research, the research on the characteristics of submicron particles has attracted extensive attention, which is of great significance to the development of industrial production, medical and health inspection and other fields. In this paper, the characteristics of submicron particles are studied based on backlight scattering. By collecting the real-time waveform of the backscattering signal of particles with different particle sizes at different concentrations, the corresponding relationship between the particle concentration and the number of pulses was obtained. It is found that the peak value of the backscattered light energy has a good linear relationship with the particle size. The analysis of the signal distribution law of standard particle swarm with different particle size parameters found that it conformed to the lognormal distribution form.

关 键 词：BACKWARD SCATTERING SUBMICRON PARTICLES LOGNORMAL DISTRIBUTION 

分 类 号：TB3[一般工业技术—材料科学与工程]