Atomic Structure of the Pt Surface after Bombardment with Ar⁺ Ions (E ~ 30 keV)  

作　　者：Vladimir Aleksandrovich Ivchenko Vladimir Aleksandrovich Ivchenko(Federal State Budgetary Institution of Science Institute of Electrophysics, Ural Branch of the Russian Academy of Sciences, Yekaterinburg, Russia)

机构地区：[1]Federal State Budgetary Institution of Science Institute of Electrophysics, Ural Branch of the Russian Academy of Sciences, Yekaterinburg, Russia

出　　处：《Advances in Materials Physics and Chemistry》2023年第5期77-84,共8页材料物理与化学进展（英文）

摘　　要：The results of the modification of the atomic structure of the Pt surface after bombardment by accelerated beams of Ar⁺ ions are presented. Field ion microscopy was used to study the irradiated surface on an atomic scale. From the analysis of the ion contrast of the atomically clean surface of platinum after bombardment with Ar⁺, a large number of radiation defects of various types were found. Individual vacancies, interstitial atoms, Frenkel pairs, depleted zones, nanoclusters of displaced atoms, etc. have been registered. It has been established that the depth of the near-surface volume of the irradiated metal with defects (except for zero-dimensional defects) is 1 - 1.5 nm for the bombardment regime: F = 10¹⁶ ion/cm² and E = 30 keV.The results of the modification of the atomic structure of the Pt surface after bombardment by accelerated beams of Ar⁺ ions are presented. Field ion microscopy was used to study the irradiated surface on an atomic scale. From the analysis of the ion contrast of the atomically clean surface of platinum after bombardment with Ar⁺, a large number of radiation defects of various types were found. Individual vacancies, interstitial atoms, Frenkel pairs, depleted zones, nanoclusters of displaced atoms, etc. have been registered. It has been established that the depth of the near-surface volume of the irradiated metal with defects (except for zero-dimensional defects) is 1 - 1.5 nm for the bombardment regime: F = 10¹⁶ ion/cm² and E = 30 keV.

关 键 词：SURFACE radiation Defects Field Ion Microscopy 

分 类 号：O57[理学—粒子物理与原子核物理]