Investigation of the Influence of Annealing Temperature on the Morphology and Growth Kinetic of Ni3Sn4 in the Ni-Sn-Solder System  

作　　者：Mathias Wendt Andreas Plö&beta l Andreas Weimar Marcus Zenger Klaus Dilger Mathias Wendt;Andreas Plöβl;Andreas Weimar;Marcus Zenger;Klaus Dilger(Institut für Füge-und Schweiβtechnik, Technische Universität Braunschweig, Braunschweig, Germany;Osram Opto Semiconductors GmbH, Leibnizstraβe 4, Regensburg, Germany)

机构地区：[1]Institut fü r Fü ge-und Schwei&beta technik, Technische Universitä t Braunschweig, Braunschweig, Germany [2]Osram Opto Semiconductors GmbH, Leibnizstra&beta e 4, Regensburg, Germany

出　　处：《Journal of Materials Science and Chemical Engineering》2016年第2期116-130,共15页材料科学与化学工程（英文）

摘　　要：The reaction between high purity nickel (99.999%) and high purity tin (99.999%) was investigated in the temperature range of 232℃ - 330℃, at short periods of annealing (1 - 60 s). The reaction kinetic was studied using cross-sectional scanning electron microscope (SEM) images. The intermetallic compound (IMC) growth was analyzed using the empirical power law and a time dependence in the range of 0.26 to 0.33 was found. The morphology of the IMC was investigated by SEM in the temperature range of 235℃ - 290℃, at annealing periods of 10 s, 30 s, and 60 s by selectively etching away the remaining elementary tin. The exposed IMC displays a change in morphology with increasing annealing temperature, demonstrating that the growth velocity of certain crystallographic orientations of the IMC is strongly influenced by the annealing temperature. Additionally, coarsening and crumbling of the IMC grains is observed, and will be discussed with respect to the responsible mechanisms.The reaction between high purity nickel (99.999%) and high purity tin (99.999%) was investigated in the temperature range of 232℃ - 330℃, at short periods of annealing (1 - 60 s). The reaction kinetic was studied using cross-sectional scanning electron microscope (SEM) images. The intermetallic compound (IMC) growth was analyzed using the empirical power law and a time dependence in the range of 0.26 to 0.33 was found. The morphology of the IMC was investigated by SEM in the temperature range of 235℃ - 290℃, at annealing periods of 10 s, 30 s, and 60 s by selectively etching away the remaining elementary tin. The exposed IMC displays a change in morphology with increasing annealing temperature, demonstrating that the growth velocity of certain crystallographic orientations of the IMC is strongly influenced by the annealing temperature. Additionally, coarsening and crumbling of the IMC grains is observed, and will be discussed with respect to the responsible mechanisms.

关 键 词：Lead-Free Solders Intermetallic Compound Formation Grain Growth COARSENING Solid Liquid Inter-Diffusion (SLID) Bonding 

分 类 号：TG1[金属学及工艺—金属学]