The Optical Parameters of Zn_xCd_(1-x)Te Chalcogenide Thin Films  

作　　者：Umeshkumar P. Khairnar Sulakshana S. Behere Panjabrao H. Pawar 

机构地区：[1]不详

出　　处：《Journal of Surface Engineered Materials and Advanced Technology》2011年第2期51-55,共5页表面工程材料与先进技术期刊（英文）

摘　　要：A procedure to make optical quality thin films of ZnxCd(1-x) Te by use of thermal evaporation of the ternary compound has been investigated. Structural and optical properties of ZnxCd(1-x)Te solid solution with x = 0.1 to 0.5 were synthesized, from the resulting ZnTe and CdTe composition used in preparation of thin films. Structural investigation indicates they have polycrystalline structure. Composition was confirmed from EDAX while SEM picture shows homogeneity in films. Plots of (αhν)2 versus (hν) yield straight line indicating direct transition occurs with optical band gap energies in the range 1.7 - 2.3 eV. It is also found with increase Zn content the band gap of the films increases. Refractive indices and extinction coefficients have been evaluated in the spectral range (200 - 2500 nm).A procedure to make optical quality thin films of ZnxCd(1-x) Te by use of thermal evaporation of the ternary compound has been investigated. Structural and optical properties of ZnxCd(1-x)Te solid solution with x = 0.1 to 0.5 were synthesized, from the resulting ZnTe and CdTe composition used in preparation of thin films. Structural investigation indicates they have polycrystalline structure. Composition was confirmed from EDAX while SEM picture shows homogeneity in films. Plots of (αhν)2 versus (hν) yield straight line indicating direct transition occurs with optical band gap energies in the range 1.7 - 2.3 eV. It is also found with increase Zn content the band gap of the films increases. Refractive indices and extinction coefficients have been evaluated in the spectral range (200 - 2500 nm).

关 键 词：Thermal Evaporation EDAX XRD OPTICAL Band Gap 

分 类 号：O48[理学—固体物理]