Depth Profile Study of Electroless Deposited Sb₂S₃ Thin Films Using XPS for Photovoltaic Applications  

作　　者：Towhid Adnan Chowdhury Towhid Adnan Chowdhury(Department of Electrical & Electronic Engineering, Ahsanullah University of Science & Technology, Dhaka, Bangladesh)

机构地区：[1]Department of Electrical & Electronic Engineering, Ahsanullah University of Science & Technology, Dhaka, Bangladesh

出　　处：《Materials Sciences and Applications》2023年第7期397-406,共10页材料科学与应用期刊（英文）

摘　　要：Sb₂S₃ has gained tremendous research recently for thin film solar cell absorber material because of their easy synthesis, unique electrical and optical properties. The stoichiometry and composition of electroless Sb₂S₃ thin films were analyzed using XPS depth profile studies. The surface layers were found nearly stoichiometric. On the other hand, the inner layer was rich in antimony composition making it more conductive electrically.Sb₂S₃ has gained tremendous research recently for thin film solar cell absorber material because of their easy synthesis, unique electrical and optical properties. The stoichiometry and composition of electroless Sb₂S₃ thin films were analyzed using XPS depth profile studies. The surface layers were found nearly stoichiometric. On the other hand, the inner layer was rich in antimony composition making it more conductive electrically.

关 键 词：Sb₂S₃ Depth Profiling X-Ray Photoelectron Spectroscopy Thin Film ELECTROLESS 

分 类 号：TB3[一般工业技术—材料科学与工程]