Project(50971011) supported by the National Natural Science Foundation of China;Project(1102025) supported by Beijing Natural Science Foundation;Project(20091102110038) supported by the Research Fund for the Doctoral Program of Higher Education of China
The introduction of electron beam(EB)brings features of both simultaneous observation of ion milling process and improvement of ion-milling accuracy in a dual beam system consisting of focused ion beam(FIB)and scannin...