相关期刊:《Advances in Chemical Engineering and Science》《Acta Metallurgica Sinica(English Letters)》《Science China Earth Sciences》《Journal of Rare Earths》更多>>
Project supported National Natural Science Foundation of China(60025409 and 50472068);National"863"High Technology Plan(2001AA311080)
High-resolution X-ray diffractometry(HRXRD)was used to assess the quality of 6H-SiC crystals grown by sublimation method.The results show the occurrence of low-angle grain boundaries(LB)is close relative to the inclin...