Buck隔离型DC/DC变换器在高剂量率条件下的总剂量辐射损伤机理研究  

Study on the Total Dose Radiation Damage Mechanism of Buck Isolated DC/DC Converters under High Dose Rate Conditions

作　　者：丛忠超 周军[1] 李占行 常耀东 王海洋 李彭 CONG Zhongchao;ZHOU Jun;LI Zhanhang;CHANG Yaodong;WANG Haiyang;LI Peng(Material Center,China Academy of Launch Vehicle Technology,Beijing 100076,P.R.China)

机构地区：[1]中国运载火箭技术研究院物资中心,北京100076

出　　处：《微电子学》2023年第6期988-993,共6页Microelectronics

基　　金：中国科学院西部之光基金资助项目(2019-XBQNXZ-B-013)

摘　　要：对国产Buck型正激DC/DC电源变换器在高剂量率辐射条件下开展电离总剂量辐照试验。分析了DC/DC电源变换器的关键电性能参数和功能随辐照总剂量的变化情况,并对DC/DC的失效机理和失效模式进行研究。通过机理分析定位辐照敏感单元。此外,还针对DC/DC的总剂量失效阈值与辐照过程中所施加的输入电压偏置和输出电流偏置的关联关系进行分析。Total Ionization dose irradiation tests were conducted on the domestic product buck type forward DC/DC power converters under high dose rate radiation conditions.The key electrical parameters and functions of DC/DC power converters were analyzed according to the Total Ionization dose,and the failure mechanism and failure mode of DC/DC were studied.The sensitive unit was located through mechanism analysis.In addition,this paper also analyzed the correlation between the failure threshold of DC/DC and the input voltage bias and output current bias applied during the irradiation process.

关 键 词：DC/DC变换器 电离总剂量辐照 损伤机理 辐射效应 VDMOS 

分 类 号：TN406[电子电信—微电子学与固体电子学] TP394.1[自动化与计算机技术—计算机应用技术] TH691.9[自动化与计算机技术—计算机科学与技术]