电路设计中CMOS器件闩锁的分析与对策  

Analysis and Countermeasure for Latch-up of CMOS Device in Electronic System Design

作　　者：王新华[1] 王建芬[1] 

机构地区：[1]浙江科技学院信息与电子工程学院,杭州310023

出　　处：《微计算机信息》2008年第5期275-277,共3页Control & Automation

基　　金：浙江省教育厅科研项目资助(20061473)项目名称:光纤CATV网络通信控制器设计研究

摘　　要：针对CMOS器件的闩锁现象,结合三种实际的应用电路分析了电路系统中闩锁的几种典型表现形式及其解决的方法,讨论了电路设计时避免闩锁的一般性原则。这些分析方法及解决措施源于实际的系统设计,并经过了大量的验证,简单有效,对于应用系统的抗闩锁设计具有普遍的参考价值。Considering the phenomenon of latch-up in CMOS device,some pattern of manifestation about latch-up in electronic sys-tem is analyzed with three actual circuits,meanwhile the correlative solve methods are also provided. To avoid latch-up,some gener-al principles are proposed. The analyzing and solving processes derived from practical system design are verified simple and effective in large number of products,and to some extend have general reference value in anti latch-up design of application system.

关 键 词：闩锁 触发 信号完整性 双电源系统 

分 类 号：TN432[电子电信—微电子学与固体电子学]