迈克耳孙干涉仪中虚空气膜厚度为零时干涉图样的讨论  

Discussion on the Interference Fringe Figure When Fabricating Air Membrance is Zero in Michelson Interferometer

作　　者：邹瑾[1] 

机构地区：[1]西昌学院数理系,四川西昌615022

出　　处：《西昌学院学报（自然科学版）》2006年第4期51-53,共3页Journal of Xichang University(Natural Science Edition)

摘　　要：针对迈克耳孙干涉仪中虚空气膜厚度为零时的干涉图样的情况,本文从理论上对干涉图样形成的原因作了定性解释,并得出结论。In view of the interference fringe figure when fabricating air membrance is zero in Michelson Interferometer. The paper explains, theoretically, the reason of interference fringe figure and draws a conclusion from it.

关 键 词：干涉仪 虚空气膜 额外程差 干涉图样 

分 类 号：O436.1[机械工程—光学工程]