用原子力显微镜测试苹果果皮超微结构  

Investigation into Microstructure of Apple Surface Using AFM

作　　者：都金丹[1] 孙霁宇[1] 佟金[1] 

机构地区：[1]吉林大学地面机械仿生技术教育部重点实验室和生物与农业工程学院,长春130025

出　　处：《华中农业大学学报》2005年第S1期91-93,共3页Journal of Huazhong Agricultural University

摘　　要：详细描述了原子力显微镜(AFM)的基本工作原理,利用原子力显微镜测试苹果果皮样品在不同时 间段的超微结构,分析其粗糙度的变化,并对AFM在果皮结构分析的前景进行了展望。The operating principle of atomic force microscope (AFM) was summarized in this paper. The microstructural features of apple surface after a period of time for separating were investigated using AFM. It was found that the surface roughness parameters were changed due to the staying for different period of time.

关 键 词：苹果果皮 原子力显微镜 超微结构 

分 类 号：S661.1[农业科学—果树学]