大功率白光LED电流应力可靠性测试  

Electric Current Stress Reliability Test of High-power White LED

作　　者：陈建新[1] 贺卫利[1] 郭伟玲[1] 高伟[1] 史辰[1] 陈曦[1] 周丹[1] 郑昕[1] 

机构地区：[1]北京工业大学电子信息与控制工程学院,北京100124

出　　处：《北京工业大学学报》2009年第3期297-300,共4页Journal of Beijing University of Technology

基　　金：北京市教委科技成果转化与产业化建设-大学科技园(05002790200703);企事业委托课题高亮度LED的应用技术与产业化研究(40002790200608).

摘　　要：为了测试大功率白光LED的可靠性,对1 W和3 W大功率白光LED进行各3组以电流为应力的可靠性试验.试验结果表明:影响大功率白光LED可靠性的主要因素为结温和荧光粉失效;大功率白光LED缓变失效过程中,光通量下降的幅度为15%～20%;试验开始阶段存在'催化升高'现象;降低pn结到环境的热阻并且改进材料生长工艺,能有效地减少非辐射复合几率,提高发光效率.In order to conduct the reliability test of LEDs,experiments,which the electric current was token as the stress,were carried on 3 groups of 1 W and 3 W white-light LEDs respectively.The experiment results show that the main factors which influence the reliability of the high-power LEDs,are temperature of junction and phosphor powder invalidation.In the process of slow invalidation,the luminous flux rate declined between 15%and 20%,and the phenomenon of'the catalysis enhance'occurred at the beginning of the ...

关 键 词：大功率白光LED 可靠性 失效 催化升高 

分 类 号：TN312.8[电子电信—物理电子学]