Position Sensitive Detector Used to Detect Beam Profile  

作　　者：Zhao Xiaoyan, Zhao Zhizheng, Zu Kailing, Zheng Jianhua and Wang Yifang 

出　　处：《IMP & HIRFL Annual Report》2001年第1期114-114,共1页中国科学院近代物理研究所和兰州重离子研究装置年报（英文版）

摘　　要：Non-destructive diagnostic methods are very important for beam adjustments and monitors,especially when the beam intensity is less than 10~8 pps during the heavy-ion treatment of cancer.Now the diagnostic devices of HIFRL can’t satisfy the requests,so we decide to construct a detecting system of the residual-gas beam profile^([1,2]).The system uses the Position Sensitive Detector(PSD)^([3,4])based on microchannel plate(MCP)

关 键 词：detecting decide satisfy destructive DIAGNOSTIC ANODE NUCLEAR resistive LINEARITY apart 

分 类 号：TH878[机械工程—仪器科学与技术]