一种基于散斑图像的嵌入式微位移测量系统的研制  

Development on an Embedded Speckle Pattern Micro-Displacement Measurement System

作　　者：刘大亮[1] 王庆[1] 刘忠[1] 张毅[1] 孙国辉[1] 白冰[1] 赵洪杰[1] 

机构地区：[1]首都航天机械公司,北京100076

出　　处：《航天制造技术》2012年第1期52-56,60,共6页Aerospace Manufacturing Technology

摘　　要：为了满足微位移量的实时、非接触测量的需要,研制了一种基于散斑图像的嵌入式微位移测量系统。从计算精度、存储资源和计算效率等角度,综合分析比较了Dirac法、IDFT法、MMSEI法和MMSEII法的测量性能,并基于MMSEI法和DSP处理器(TMS320DM642)设计实现该测量系统。重点论述了系统软件和实验系统的设计与实现方法,并分别在不同运动速度、表面粗糙度和表面材料的条件下,对测量系统进行实验和数据分析。实验结果表明,该测量系统是可行有效的,但系统的稳定性需要进一步改进和提高。In order to satisfy the need of real-time and non-contact measurement of micro-displacement,an embedded micro-displacement measurement system is developed based on the speckle pattern.Taking into account of the accuracy,the size of memory and the efficiency,the measurement characteristics of the various measurement algorithms,including Dirac,IDFT,MMSEI and MMSEII,were analyzed and compared,respectively.Furthermore,the algorithm MMSEI and the DSP micro-processor(TMS320DM642) were picked out to design and implement the measurement system.In addition,the methods to design and implement the software as well as the experimental system were described emphatically.Finally,the testing experiments of the measurement system and the data analysis were implemented using sorts of testing specimens,such as the diverse velocity,the different surface roughness and the unlike surface materials.The experiment results show that the developed measurement system is feasible and effective;meanwhile,the stability of the system should be improved and enhanced farther.

关 键 词：微位移测量 散斑图像 嵌入式系统 

分 类 号：TH822[机械工程—仪器科学与技术]