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作 者:陈朝方[1] 许彩芸[1] 彭彬[1] 徐泽[1] 伍利兵[1] 李杰[1]
机构地区:[1]珠海出入境检验检疫局技术中心,珠海519015
出 处:《食品安全质量检测学报》2013年第4期1046-1052,共7页Journal of Food Safety and Quality
基 金:珠海出入境检验检疫局科研基金项目(ZH2013-9)~~
摘 要:目的采用微区能量色散X荧光光谱仪(μ-EDXRF)研究陶瓷釉料的变化和铅、镉等重金属溶出的风险以评估产品的质量安全。方法采用μ-EDXRF元素扫描成像新技术,分析釉层有害金属元素的分布,并用无标样基本参数(FP)法测定釉层主成分和高风险区域有害元素的含量。结果μ-EDXRF能快速进行多元素同时分析,可以及时发现釉层中钴、铬、锰、镍等具有潜在析出风险的重金属元素。该元素成像技术能直观地找出有害元素存在的部位,方便迅速分析产品缺陷的原因。结论该方法从一个新的角度来评价陶瓷釉层重金属元素含量及分布,是已有分析手段的一个有力补充。Objective To study the chemical change of ceramic glaze and the risk of lead, cadmium and other heavy metal migration detected by micro energy dispersive X fluorescence spectrometer (μ-EDXRF), which promotes the quality and safety evaluation of the product. Methods The distribution of heavy metals on glaze layer was measured byμ-EDXRF, and the content of main composition or harmful metal elements in the high risk glaze layer were detected by non-standard fundamental parameter (FP) method. Resultsμ-EDXRF could analyze multi-element simultaneously within a shot-time, and detect the potential toxic ele-ment in the glaze, such as cobalt, chromium, manganese, and nickel. The element mapping of glaze layer could directly display the distribution of heavy metal, and the defects were analyzed conveniently. Conclusion This is a new way to evaluate heavy metal content and distribution in the ceramic glaze, which is a powerful sup-plement of traditional analysis methods.
关 键 词:微区能量色散X荧光光谱 元素成像 陶瓷 釉层 重金属
分 类 号:TQ174.1[化学工程—陶瓷工业] O657.34[化学工程—硅酸盐工业]
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