K-Ar dating of extensional fault gouge from the Yi-Shu segment of the Tan-Lu fault zone  

作　　者：WANG YongSheng ZHU Guang HU ZhaoQi ZHANG BiLong XIANG BiWei XIE ChengLong 

机构地区：[1]School of Resource and Environmental Engineering,Hefei University of Technology,Hefei 230009,China

出　　处：《Science China Earth Sciences》2009年第4期489-503,共15页中国科学（地球科学英文版）

基　　金：Supported by National Natural Science Foundation of China (Grant Nos. 90714004, 40672131)

摘　　要：Two grabens were developed in the Yi-Shu segment of the Tan-Lu fault zone (TLFZ) during its extensional activities, and are now confined by four major NNE-trending normal faults and filled with Cretaceous sediments. These faults were developed due to their reactivities, containing gouge and cutting the graben sediments. Detailed fieldwork demonstrates that the faults experienced sinistral transtensional moment related to regional NE-SW extension during the reactivity. X-ray diffraction (XRD) analysis of the finest gouge samples gives illite crystallinity values higher than 0.42°Δ2θ, indicating temperatures experienced by the gouge samples were less than 150°C. From the relation between K-Ar data and proportions of detrital illite in different size fractions of the gouge samples, we conclude that refaulting for the western boundary fault of the TLFZ, abbreviated to F4, took place at ca. 90 Ma and for the eastern boundary fault, abbreviated to F1, happened from 70 to 60 Ma. During the two phases of reactivity imposed by the same NE-SW extension, the TLFZ experienced uplifting and no sediments were deposited in the two grabens. It is suggested that the TLFZ experienced extension during the Late Cretaceous, which supports the inference that lithospheric thinning was still undergoing in the east of the North China Craton during the Late Cretaceous magmatic hiatus.Two grabens were developed in the Yi-Shu segment of the Tan-Lu fault zone (TLFZ) during its exten-sional activities, and are now confined by four major NNE-trending normal faults and filled with Creta-ceous sediments. These faults were developed due to their reactivities, containing gouge and cutting the graben sediments. Detailed fieldwork demonstrates that the faults experienced sinistral transten-sional moment related to regional NE-SW extension during the reactivity. X-ray diffraction (XRD) analysis of the finest gouge samples gives illite crystallinity values higher than 0.42o?2θ, indicating temperatures experienced by the gouge samples were less than 150℃ . From the relation between K-Ar data and proportions of detrital illite in different size fractions of the gouge samples, we conclude that refaulting for the western boundary fault of the TLFZ, abbreviated to F4, took place at ca. 90 Ma and for the eastern boundary fault, abbreviated to F1, happened from 70 to 60 Ma. During the two phases of reactivity imposed by the same NE-SW extension, the TLFZ experienced uplifting and no sediments were deposited in the two grabens. It is suggested that the TLFZ experienced extension during the Late Cretaceous, which supports the inference that lithospheric thinning was still undergoing in the east of the North China Craton during the Late Cretaceous magmatic hiatus.

关 键 词：Yi-Shu SEGMENT of the Tan-Lu FAULT zone EXTENSIONAL FAULT GOUGE K-Ar dating of ILLITE X-ray diffraction 

分 类 号：P597.3[天文地球—地球化学]