Depth profiling of SBS/PET layered materials using step-scan phase modulation Fourier transform infrared photoacoustic spectroscopy and two-dimensional correlation analysis  

Depth profiling of SBS/PET layered materials using step-scan phase modulation Fourier transform infrared photoacoustic spectroscopy and two-dimensional correlation analysis

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作  者:LI BoBin & ZHANG PuDun State Key Laboratory of Chemical Resource Engineering Beijing University of Chemical Technology,Beijing 100029,China 

出  处:《Science China Chemistry》2010年第5期1189-1193,共5页中国科学(化学英文版)

基  金:support from the Young Scholars' Research Funds of Beijing University of Chemical Technology(QN0728)

摘  要:This paper demonstrates the application of step-scan phase modulation Fourier transform infrared photoacoustic spectroscopy(FTIR-PAS) in non-destructively depth profiling of styrene-butadiene-styrene block copolymer/polyethylene terephthalate(SBS/PET) layered materials.The surface thicknesses of three layered samples were determined to be 1.2,4.3 and 9.4μm by using phase difference analysis,overcoming the spatial detection limits of FTIR.Combined with generalized two-dimensional(G2D) FTIR correlation analysis,the spatial origins of peaks in the SBS/PET spectrum are identified with those having overlapping peaks between different layers are resolved.This paper demonstrates the application of step-scan phase modulation Fourier transform infrared photoacoustic spectroscopy(FTIR-PAS) in non-destructively depth profiling of styrene-butadiene-styrene block copolymer/polyethylene terephthalate(SBS/PET) layered materials.The surface thicknesses of three layered samples were determined to be 1.2,4.3 and 9.4μm by using phase difference analysis,overcoming the spatial detection limits of FTIR.Combined with generalized two-dimensional(G2D) FTIR correlation analysis,the spatial origins of peaks in the SBS/PET spectrum are identified with those having overlapping peaks between different layers are resolved.

关 键 词:DEPTH PROFILING FTIR PHOTOACOUSTIC STEP-SCAN two-dimensional correlation analysis LAYERED materials 

分 类 号:O657.3[理学—分析化学]

 

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