ATE测试中的Bandgap Trim技术研究  

The Research of Bandgap Trim for ATE Test

作　　者：葛南[1] 陈东坡[1] 

机构地区：[1]上海交通大学微电子学院,上海200240

出　　处：《微电子学与计算机》2015年第4期70-74,78,共6页Microelectronics & Computer

摘　　要：由于工艺的影响,带隙基准电压会有一定的偏差,在ATE测试阶段,需要利用trim技术对基准电压进行修调.通过一种EEPROM修调电路,在EEPROM中写入trim code来控制与trim电阻并联的开关,以达到修调基准电压的目的.同时采用了一种新颖的自动修调算法,只需要测试基准电压的初始值,就可以自动找出最佳的trim code,对于每个芯片来说既可以节省长达63.3ms的测试时间,又能够保证测试准确,降低了测试成本.通过对300个芯片的基准电压测试结果的分析,验证了这种算法的准确性.Because of process variation,there will be some voltage deviations in bandgap reference.So we need to trim the bandgap reference in ATE testing phase.An EEPROM circuit can be used to trim the Bandgap voltage.The switches parallel with the resistances can be controlled by writing trim code to EEPROM.A novel algorithm called automatic trimming is also introduced.This algorithm is able to find the best trim code only according to the initial bandgap voltage.Test time is reduced as much as 63.3 ms and accuracy can also be ensured.The bandgap test results of 300 samples are analyzed to verify the accuracy of the proposed algorithm.

关 键 词：带隙基准 TRIM EEPROM 自动修调 

分 类 号：TN407[电子电信—微电子学与固体电子学]