聚酯薄膜电子陷阱捕获截面的研究  

Investigation of Electronic Capture Cross Section in Poly(ethylene terephthalate)Films

作　　者：王玉芬[1] 杨百屯[1] 曹晓珑[1] 刘耀南[1] 刘付德 

机构地区：[1]西安交通大学,华南理工大学

出　　处：《电工技术学报》1993年第2期61-64,60,共5页Transactions of China Electrotechnical Society

摘　　要：本文利用电荷注入技术和表面电位测试技术研究了高电场作用下聚酯薄膜中电子陷阱的捕获截面与电场强度之间的关系。理论分析和实验结果拟合得到,在本文所研究的电场范围(1×107～1×108V/m)内,陷阱捕获截面随外施电场强度的上升而以指数规律下降。利用电场作用时的Poole-Frenkel效应和电子加热效应解释了本文的实验现象。The relationship between the capture cross sections of POly (ethylene terephthalate)films under high fields and the electrical fields is studied by the means of the charge injection and surface potential measurement techniques. By integrating theory analysis with experimental results, we can obtain the capture cross section decreases exponentially with the applied fields within the field range from 1×107V/m to 1×108V/m. This phenomenon is interpreted from Poole-Frenkel effect and electron heating effect.

关 键 词：电介质 聚酯薄膜 电场 

分 类 号：TM215.3[一般工业技术—材料科学与工程]