SOC芯片设计与测试  

SOC design and test

作　　者：谈颖莉 戎蒙恬[2] 

机构地区：[1]上海贝岭技术中心,上海200233 [2]上海交通大学,上海200030

出　　处：《半导体技术》2004年第6期64-67,75,共5页Semiconductor Technology

摘　　要：SOC已经成为集成电路设计的主流。SOC测试变得越来越复杂,在设计时必须考虑DFT和DFM。本文以一SOC单芯片系统为例,在其设计、测试和可制造性等方面进行研究,并详细介绍了SOC测试解决方案及设计考虑。SOC (system-on-chip) products are more popular in nowadays. With the developmentof SOC design, SOC test becomes more and more complex. For high volume products, modern SOCdesign should take more consideration on design-for-test and design-for-manufacturability. Wepresent a case study of an SOC on design, test, and manufacturability, and carry out some ideas onSOC design and testing.

关 键 词：单芯片系统 面向测试设计 面向制造设计 位失效图 自动测试设备 

分 类 号：TN402[电子电信—微电子学与固体电子学]