高纯氧化钬的电感耦合等离子体原子发射光谱分析及光谱干扰的校正  

Determination of Trace Rare Earth Element Impurities in High Purity Holmium oxide by Inductively Coupled Plasma-Atomic Emission Spectrometry and Correction of Spectral Interferences

作　　者：袁甫[1] 綦文娣[1] 郝志平 

机构地区：[1]中国科学院长春应用化学研究所,长春130022 [2]国营第八二七二厂

出　　处：《分析化学》1993年第8期918-920,共3页Chinese Journal of Analytical Chemistry

摘　　要：本文提出了以PGS-2型平面光栅摄谱仪与Plasma Therm ICP-5000D射频发生器联用,乙醇溶液预去溶进样方法,直接同时测定高纯氧化钬中5个稀土杂质元素的方法,并讨论了基体浓度对分析方法检出限的影响和光谱干扰及其校正。当样品溶液中稀土总浓度为5mg/ml时,测定下限分别为铽0.003％,镝、铒和铥0.002％,钇0.0003％。其相对标准偏差为2.8％～7.4％。The direct simultaneous determination of five trace rare earth impurities in high purity holmium oxide was described. The sample solution containing ethanol was introduced into the plasma with desolva-tion. The effect of matrix concentration on the detection limit, and the calculation and correction of spectral interferences in ICP-AES have been investigated. For the sample solution containing 5 mg/ml of Ho2O3. the determination limit was 0. 003% for Tb4O7, 0. 002% for Dy2O3, Er2O3 and Tm2O3 and 0. 0003% for Y2O3, respectively, the relative standard deviation was in the range of 2.8%-7. 4%.

关 键 词：氧化钬 光谱干扰 稀土杂质元素 ICP 

分 类 号：O614.343[理学—无机化学]