微束X射线荧光分析  

MICRO-BEAM XRF ANALYSIS

作　　者：乐安全[1] 朱节清[1] 谷英梅[1] 

机构地区：[1]中科院上海原子核研究所,上海201800

出　　处：《光谱学与光谱分析》1993年第3期79-82,92,共5页Spectroscopy and Spectral Analysis

基　　金：国家自然科学基金

摘　　要：用能量色散微束X射线荧光分析仪实际测量了微束准直器孔径和X射线强度对微束空间分辨率的影响,在准直器孔径为0.1mm条件下,获得以FWHM定义的空间分辨率最好为0.073mm。通过微束扫描测量出某硫化锰矿微区内的Mn、Fe、Zn、Pb的三维等高线荧光强度分布图和不同小区域内的能谱。The influence of micro-beam collimator aperture and X-ray intensity upon beam spatial resolution was investigated by an energy dispersion micro-beam XRF instrument. Thebest spatial resolution definated by FWHM for 0.1mm collimator aperture is 0.073mm. Contour maps of three dimensional intensity distribution of Mn, Fe, Zn, and Pb and the XRF energy spectra collected from different interesting areas have been obtained by microbeam scanning measurement.

关 键 词：微束 X射线 荧光分析 

分 类 号：O657.34[理学—分析化学]