X射线弯晶谱仪的几何因数对色散角的影响  

The dispersive angle effected by the geometrical factors of the x-ray bent crystal spectrometers

作　　者：卢向东[1] 欧伟英[2] 

机构地区：[1]桂林电子工业学院电子工程系光信息科学与技术教研室,桂林541004 [2]复旦大学应用离子束物理教研部重点实验室,上海200433

出　　处：《激光杂志》2004年第6期85-87,共3页Laser Journal

摘　　要：在假设谱线的固有宽度可以忽略的情况下 ,本文成功地应用了柱坐标系统来进行定量的分析在弯晶谱仪中由于晶体的几何结构和光源的大小对色散角的影响。为了更具普适性 ,分析了Johann晶体谱仪和点光源 ,同时还有球面晶体谱仪和Johanson晶体谱仪。In the assumption of the spectral line profile caused by itself is neglected,the paper successfully apply the cylindrical coordinates to have quantitative analyses of the dispersive angle effected by the crystal geometrical structure and the size of the source with a curved-crystal spectrometer.To make more generalization,the paper analyses the Johann spectrometer and a point source,and the paper also analyses spherical spectrometer and Johanson spectrometer.finally,comparing the result with others and showing the schematics analyses of the effects.

关 键 词：弯晶谱仪 柱坐标 色散角 

分 类 号：TN248.1[电子电信—物理电子学]