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作 者:臧国忠[1] 王矜奉[1] 陈洪存[1] 苏文斌[1] 王文新[1] 王春明[1] 亓鹏[1]
出 处:《压电与声光》2004年第6期457-459,共3页Piezoelectrics & Acoustooptics
基 金:国家自然科学基金资助项目(50072013)
摘 要:研究了Nb2O5对ZnO压敏材料电学性能的影响。当x(Nb2O5)从0增加到1%时,ZnO压敏电阻的击穿电压从209V/mm降至0.70V/mm,40Hz时,样品电阻从0.21MΩ降至48.3Ω,1kHz时的相对介电常数从831增大到42200。晶界势垒高度测量表明:在实验范围内,Nb对势垒高度的影响较小。ZnO晶粒的变大是压敏电压急剧降低和介电常数增大的主要原因。对Nb掺杂量的增加引起样品阻抗减小的根源进行了解释。The effect of Nb_2O_5 on the electrical properties of ZnO based varistors was investigated. The breakdown voltage of the ZnO based varistors decreased from 209 V/mm to 0.7 V/mm and the impedance of the samples decreased from 0.21 MΩ to 48.3 Ω at 40 Hz with increasing Nb_2O_5 concentration from 0 to 1.0 % and the relative dielectric constants increased from 831 to 42 200 at 1 kHz at the same time. Measurement of barrier height at grain boundaries revealed that the Nb_2O_5 concentration has less influence on barrier hight in this experimental range. The increase of ZnO grain size with increasing Nb_2O_5 concentration from 0 to 1.0 % is the substantial reason for raising of breakdown voltage and relative dielectric constants. The origin for the decrease of impedance of the samples caused by increasing Nb_2O_5 concentration was explained.
分 类 号:TN379[电子电信—物理电子学]
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