甘蔗茎中化学元素的微区分布  

Distribution of Chemical Elements in Sugarcane Stem

作　　者：张树滨[1] 邱玉桂[1] 方观瑞[1] 

机构地区：[1]华南理工大学制浆造纸工程国家重点试验室,广州510641

出　　处：《中国造纸学报》2004年第2期6-10,共5页Transactions of China Pulp and Paper

基　　金：国家自然科学基金 (2 0 2 770 1 2 )资助项目

摘　　要：用扫描电镜 能谱仪研究了甘蔗茎皮层的外表面和横切面中Si等元素的含量及分布。结果表明 ,皮层外表面不同形态区域中Si等元素的含量不同 ,颗粒物是Si高度密集的部位 ,Si的含量高达 58.2 3 % ;平坦处的Si含量较低 ,为 44 .42 % ;颗粒物块及其连接处中所含Si的原子数相同 ,但所含C、O元素的原子数则相反。横切面中 ,皮层中Si的密度高且分布呈外层低里层高的规律性 ;维管束及薄壁细胞中Si的含量较低且分布较均匀 ,皮下纤维层中Si的含量最低 ,具有明显不同于麦秆的特点。实验结果预示不同部位中硅化物的组成及元素化学状态的差异。Distribution of chemical elements in cuticle and the transverse section of sugarcane stem were studied by means of SEM-EDAX. The results show that the content of silicon and other chemical elements in various morphological regions of cuticle surface is different, the granules are rich of silicon, where its content is up to 58.23 percent, on the other hand,the flat area has a little lower content of 44.42 percent. The atom number of silicon in granule body and its surrounding area are the same, but that of carbon as well as oxygen are contrary. In transverse section, the concentration of silicon in cuticle is the highest, in the regions of fibrovascular bundle and parenchyma tissue is lower but uniform, and in fibrious layer is the lowest. The profile of chemical elements is distinct from that of wheat stem. The results indicate the difference of compositions of silicides and the chemical states of elements concerned in various regions.

关 键 词：甘蔗茎 化学元素 扫描电镜 能谱仪 硅 造纸工业 

分 类 号：TS724[轻工技术与工程—制浆造纸工程] TS713