X射线法测量的ICF靶丸参数的图像分析  

Image ananlyses of ICF target by X-ray measurement

作　　者：杨冬[1] 虞孝麒[1] 龚达涛[1] 

机构地区：[1]中国科学技术大学近代物理系,安徽合肥230026

出　　处：《强激光与粒子束》2004年第12期1553-1557,共5页High Power Laser and Particle Beams

基　　金：国家863计划项目资助课题

摘　　要：　在ICF靶丸参数测量中,采用接触X射线显微辐射照相法获得靶核的X射线吸收底片图像,将该底片放置于显微镜下并用CCD获得了数字化图像。基于该数字化图像信息,编写了一套完整的计算机算法来计算靶参数。采用辐向平均法标定出靶中心,采用图像强度函数对半径的二阶微分来确定出靶层分界位置,计算精度约为0.2pixels。The X-ray radiography technique was used to measure ICF targets and record film images of microspheres using contact microradiography. Then the film images were set under the microscope and converted to digital images by a CCD camera. Based on the information of these digital images,a computer algorithm has been developed for calculating the target shell parameters. This accepted procedure first locates the center of the microsphere using radial averaging of X-ray images, then calculate the radial second derivative of X-ray transmission intensity through a shell to locate the points of inflection in the transimssion intensity vs radius plot which denote the layer interfaces with the accuracy of about 0.2pixels.

关 键 词：ICF靶 X射线法 辐向平均法 二阶微分 

分 类 号：TP274.2[自动化与计算机技术—检测技术与自动化装置]