用红外透射法确定任意厚度下碲镉汞晶体的组分  

The Determination of Cadmium-Mercury Telluride Composition for Any Thickness by Infrared Transmission

作　　者：杨彦[1] 刘新进[1] 

机构地区：[1]昆明物理研究所,云南昆明650223

出　　处：《红外技术》2005年第1期39-41,共3页Infrared Technology

摘　　要：选用组分均匀的碲镉汞Hg1-xCdxTe晶片(x=0.170-0.300mole CdTe),在室温下用红外光谱仪 测量晶片在不同厚度的透射光谱,取透射比为5％对应的波数值,对实验数据进行拟合,得到了碲镉 汞晶体组分与透射比为5％对应的波数值和晶片厚度之间的经验关系式(简称经验式)。结果表明:用本 文的经验式得到的组分值不受晶片厚度的影响,准确而可靠。本文拟合的经验式适用于红外透射法测 量任意厚度碲镉汞材料的组分计算,同时还可用它研究Hg1-xCdxTe晶片组分的均匀性。The use of automated infrared spectrophotometer system to measure IR transmission curves of Hg1-xCdxTe (x=0.170-0.300 mole) which have composition uniformity for several thickness at 300K was described. The frequency corresponding to 5% absolute transmission was used to construct relation between the frequency and the corresponding composition and thickness of Hg1-xCdxTe. We have shown that the composition values obtained from the relation are accuracy and no influence of the thickness. The relation can be used to calculate the composition and analysis the composition uniformity in the Hg1-xCdxTe by infrared transmission.

关 键 词：晶片 碲镉汞材料 厚度 透射比 透射光谱 晶体 均匀性 红外透射 组分 红外光谱仪 

分 类 号：TN215[电子电信—物理电子学] TN305