遗传算法的板级边界扫描测试矢量优化及应用  

Optimization and Application of PCB Test Set by GA Based on Boundary-Scab Technology

作　　者：尚玉玲[1] 颜学龙[1] 雷加[1] 李春泉[2] 

机构地区：[1]桂林电子工业学院电子工程系,桂林541004 [2]桂林电子工业学院机电与交通工程系,桂林541004

出　　处：《计算机工程与应用》2004年第20期205-207,共3页Computer Engineering and Applications

基　　金：国家部委项目资助;广西区教育厅2002年项目支持

摘　　要：测试矢量是边界扫描技术的关键之一,测试矢量集直接影响测试的效率和结果。文章将遗传算法引入可测性设计中的边界扫描测试领域,以PCB、MCM等为工程对象,探索了遗传算法的互连测试矢量生成,提出了具有互连测试特性的适应度函数、遗传算子和遗传操作,并进行了仿真实验和实际的DEMO板测试,结果表明该算法具有一定的优越性。Test generation is one key technologies of boundary scan.Test set affects test efficiency and results directly.Genetic Algorithm(GA)is inducted to boundary scan test in field of DFT(Design For Testability)in this paper.PCB(Printed Circuit Board)and MCM(Multi-chip Module)are taken as project objects to explore a novel algorithm of GA interconnect test generation.Based on the characteristic of interconnect,the fitness function and genetic operators are put forward.Through the imitation and test in practice for DEMO board developed by ourselves,that shows the algorithm is superior to other algorithms to some extent.

关 键 词：边界扫描 遗传算法 互连测试 

分 类 号：TP39[自动化与计算机技术—计算机应用技术]