SLM彩色显微图像的亚像素边缘检测方法  

SUB-PIXEL EDGE DETECTION METHOD FOR SLM COLOR MICROSCOPIC IMAGES

作　　者：刘冲[1] 夏泽邑[1] 裴伟[2] 沙里瓦特[2] 

机构地区：[1]大连理工大学微系统研究中心,大连116024 [2]大连理工大学精密与特种加工教育部重点实验室,大连116024

出　　处：《机械工程学报》2005年第1期71-76,共6页Journal of Mechanical Engineering

基　　金：国家自然科学基金(50275023)国家自然科学重点基金(50135040)资助项目。

摘　　要：微操作技术的迅速崛起迫切要求显微图像处理技术的发展。在HSI彩色模型的基础上,根据SLM视觉系统的彩色显微图像特点,基于小波变换提出了一种适用于SLM彩色显微图像的边缘检测方法。根据三次样条拟合曲线的一阶导数零点,获取精确的亚像素边缘。试验证明,该方法适用于各放大倍率下的SLM彩色显微图像,能较好地滤除噪声,检测出完整的亚像素边缘。给出了利用该算法处理噪声仿真图像和真实SLM彩色显微图像的试验结果。The great development in micromanipulation technology has exigent request to develop image processing for the microscopic image. According to the characteristic of the SLMcolor microscopic image in micromanipulation imaging system, a method for edge detection based on wavelet transformation and HS1 is proposed. Then, the interested area of the image is interpolated using cubic spline and accurate sub-pixel edges are obtained based on the zero point of first-order derivatives of cubic spline curve. The experiment result shows that this method is effective for SLM color microscopic images with various magnifications. This method can filter noise from SLM color microscopic images effectively and detect satisfactory edge. Moreover, the method is applied to images with simulated noise and real images. The experiment results are given at the end.

关 键 词：小波变换 HSI彩色模型 亚像素边缘检测 三次样条 彩色显微图像 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]