不同状态下激光器电场强度分布的电光检测与初步分析  

Analysis and measurement on distribution of electic field in GaAs/AlGaAs lasers under different bias

作　　者：王硕勤 朱祖华[1] 

机构地区：[1]浙江大学信息与电子工程系,杭州310008

出　　处：《中国激光》1993年第10期794-799,共6页Chinese Journal of Lasers

基　　金：国家八六三计划光电子主题的支持

摘　　要：连续波电光检测技术是近几年发展起来的测量光电材料及光电材料制备的器件的电特性的一种新型测量技术。它基于线性电光效应。采用连续波激光作为测量手段。 CW EOP技术已在GaAs,LiNbO_3等光电材料及器件的电场分布检测中得到实质性应用。采用CWEOP技术对半导体激光器内场分布电光检测的初步结果在文献[4]中已有报道,本文是对激光器在不同状态下进行场分布电光检测的更进一步探讨。According to the basic principle of CWEOP (Continue Wave Electro-Optic Probing), we detect the distribution of the electric field of two types of GaAs/GaAlAs heterojuction lasers (the proton- bombed and the broad- area contact). The experimental results obtained at different areas and under different bias conditions reflect the characteristics of lasers such as carrier confinement, the change of the distribution of electric field corresponding to different bias currents and the distribution of electric field under negative bias.

关 键 词：激光器 电场强度 分布 光电检测 

分 类 号：TN247[电子电信—物理电子学]