大容量EPROM的随机图形测试方法  

The Random Pattern Test Method for VLSI EPROM

作　　者：范恒[1] 须国宗[1] 徐元森[1] 

机构地区：[1]中国科学院上海冶金所

出　　处：《微电子学与计算机》1989年第2期4-7,共4页Microelectronics & Computer

摘　　要：基于对EPROM读写特性和故障模型的分析,本文提出了采用随机测试图形的EPROM功能测试方法.这不仅可提高译码电路故障的检测率,而且能切实地反映出存贮单元状态间的耦合故障,比使用传统测试图形的功能测试具有更大的优越性.在微机上由线性反馈移位寄存器产生随机图形并采用快速编程技术成功地实现了用随机图形对EPROM进行测试.VLSI EPROM has writing characters much different from other IC memories and very time consuming in functional testing.It has become major problem how to select the appropriate test pattern and programming method in order to increase failure detectability and reduce test time According to failure models of EPROM, we developped a test method using random patern which generated by linear feedback shift register can detect failed memory cells, decoders and all other circuits, and is more effective than the regular test pattern in the functional test of EPROM.

关 键 词：EPROM 随机图形测试 EPROM测试 

分 类 号：TP333.7[自动化与计算机技术—计算机系统结构]