荧光光谱仪红外波段荧光强度的校正  

Correction of fluorescence intensity in infrared region of fluorescence spectrometer

作　　者：臧竞存[1] 陈檬[2] 单秉锐[1] 朱建慧[3] 

机构地区：[1]北京工业大学材料科学与工程学院,北京100022 [2]北京工业大学激光工程研究院,北京100022 [3]华北光电技术研究所,北京100015

出　　处：《分析仪器》2005年第2期46-47,共2页Analytical Instrumentation

摘　　要：一般荧光光谱仪由于光栅闪耀效果和CCD响应下降,导致1μm波长附近接收到的荧光发射信号减弱。本文介绍一种通过数学处理和基线调整校整荧光光谱仪红外波段荧光强度的方法,从而可以在一般荧光光谱仪上获得与高档荧光光谱仪接近的荧光光谱图。For common fluorescence spectrometer, the fluorescence emission signal near 1 μm is weak due to the decreace of efficiency of blazed grating and the response of CCD. This paper describes a method which can correct the fluorescence intensity in infrared region of fluorescence spectrometer through mathematical process and baseline adjustment, thus fluorescence spectra similar to that obtained with advanced instrument can be achieved with common fluorescence spectrometer.

关 键 词：荧光光谱仪 荧光强度 红外波段 校正 发射信号 数学处理 光谱图 

分 类 号：TH744.1[机械工程—光学工程]