麦蚜对小麦冠层光谱特性的影响研究  

Effects of wheat aphid on spectrum reflectance of the wheat canopy

作　　者：乔红波[1] 程登发[1] 孙京瑞[1] 田喆[1] 陈林[1] 林芙蓉[1] 

机构地区：[1]中国农业科学院植物保护研究所,北京100094

出　　处：《植物保护》2005年第2期21-26,共6页Plant Protection

基　　金："973"国家重点基础研究项目(G2000016206);"十五"国家科技攻关项目(2004BA509B01);国家科技基础平台工作重点项目(2003DIA6N004)

摘　　要：通过对田间不同程度麦蚜危害的小麦冠层反射光谱测量,研究了各波段反射光谱的变异特征,并对光谱反射曲线进行微分分析。结果表明:在麦蚜危害的初期,近红外反射率明显降低,即陡坡效应受到明显的削弱,随着麦蚜危害程度加重,小麦冠层的反射率在不同波段有明显下降,尤其在近红外区下降更为显著。利用光谱微分技术,对受麦蚜不同程度危害的小麦冠层反射率求一阶导数,得到红边斜率。结果表明,麦蚜危害后小麦冠层的红边斜率在近红外波段发生剧烈的变化,且随着危害程度的加重其值逐步下降。将归一化植被指数(NDVI)分别和百株蚜量进行相关及回归分析,并对监测蚜虫敏感波段的选择做了初步的探讨。The spectrum features on wheat canopy were studied by measuring and analyzing the reflectance and differential spectrums at 5 infested levels by wheat aphid. With the increase of infestation by wheat aphid, the percent reflectance on wheat canopy decreased at green, red and near infrared bands, while at near infrared band the decrease was evident. The result of differential spectrum showed that the first derivative has great change at near infrared band. The correlation and regression between Normalized Difference Vegetable Index (NDVI) and aphid numbers on 100 trunks of wheat were cal- culated. And the choice of sensitive band for monitoring wheat aphids was discussed. This study provides an experimental reference for forecasting of early infestation and infestation degree by wheat aphid with remote sensing.

关 键 词：麦蚜 冠层 小麦 光谱特性 归一化植被指数 光谱反射曲线 危害程度 红外反射率 近红外波段 光谱测量 变异特征 反射光谱 微分分析 近红外区 一阶导数 回归分析 下降 行相关 加重 斜率 红边 田间 蚜虫 

分 类 号：S435.122.2[农业科学—农业昆虫与害虫防治] O484.41[农业科学—植物保护]