电子探针观察氧化锆与树脂黏接断面的研究  

Investigation of fractured interfaces between 3Y-TZP and bonding resin by EPMA

作　　者：李莹[1] 张富强[1] 郑珊[2] 靳喜海[2] 孙静[2] 高濂[2] 

机构地区：[1]上海第二医科大学附属第九人民医院口腔医学院口腔修复科,上海200011 [2]中国科学院上海硅酸盐研究所高性能陶瓷与超微结构国家重点实验室,上海200050

出　　处：《口腔医学》2005年第2期90-92,共3页Stomatology

基　　金：上海市科委基金资助项目 (0 3JC14 0 5 3 ) ;上海第二医科大学博士学科点建设基金项目 (BXJ0 3 10 )

摘　　要：目的　观察经二氧化硅(silica ,SiO2 )表面处理的摩尔分数为3%的氧化钇稳定的四方多晶氧化锆(3Y -TZP)与树脂黏接后的断面,了解SiO2 表面处理在3Y -TZP与牙科树脂黏接中的作用。方法　用溶胶-凝胶法在4个3Y -TZP试样上制备SiO2 薄膜作为薄膜组;另外4个3Y -TZP试样作为对照组。分别用EPMA 870 5QH2 电子探针和INCAEnergy能谱仪观察两组试样在拉伸剪切试验后的黏接断面。结果　背散射电子形貌像显示两组的3Y -TZP基底面均未破坏,但薄膜组表面残留的树脂黏接剂颗粒较多。电子探针能谱分析显示薄膜组在3Y -TZP表面存在比对照组高的硅峰谱。结论　经SiO2 表面处理后的3Y-TZP可提高与牙科树脂的黏接力。Objective To study the fractured interfaces of SiO_2 coated x(Y_2O_3)=3% yttria stabilized tetragonal zirconia polycrystal (3Y-TZP) in order to investigate the effect of SiO_2 surface treatment upon 3Y-TZP in resin bonding process. Methods SiO_2 thin films were coated on four 3Y-TZP specimens by sol-gel methods, which was thin film group. The other four specimens were control group. The fractured interfaces between specimens and bonding resin were determined by electron probe X-ray microanalyser (EPMA) and energy dispersive spectrometer (EDS) after shear bond test. Results BEI(topo) (Topography Image from Backscattered Electron) observations showed that although the surface of each specimen was integrated, the surface configurations were different between two groups: the amount of fractured resin luting cement left on the thin film group was more than that left on the control group. The height of Si peak detected in the thin film group was higher than that in the control group by EPMA. Conclusion SiO_2 surface treatment on 3Y-TZP can enhance the bond strength between resin and 3Y-TZP.

关 键 词：电子探针 剪切断面 表面处理 氧化锆 树脂黏接剂 

分 类 号：R783.1[医药卫生—口腔医学]