二次热处理的SrTiO_3压敏陶瓷电性能的研究  

Study on Properties of Double-heat-treatment SrTiO_3 Capacitor-varistor Ceramic

作　　者：牛丽霞[1] 周方桥[1] 陈志雄[1] 庄严 

机构地区：[1]广州大学物理与电子工程学院,广东广州510405 [2]广州新日电子有限公司,广东广州510335

出　　处：《电子元件与材料》2005年第5期11-13,共3页Electronic Components And Materials

基　　金：广州市科技计划资助项目(2002JI-C0191)

摘　　要：采用逐层研磨及电测量的方法,对800～1050℃不同温度下,热处理的SrTiO3陶瓷电容–压敏元件的表面氧化层进行了研究.结果表明:该类元件存在明显的表面氧化层结构,且随着热处理温度升高,表面氧化层厚度增大,800～1000℃不同温度热处理的样品,其表面氧化层厚度为26～107μm;表面氧化层内扩散氧的浓度和晶界势垒的高度是由表及里逐渐减小的.Properties of the oxidized surface layer of SrTiO3 ceramic ring capaciter-varistors which were reoxidized at different temperature of 800~1 050℃ in aerial were studied with polishing layer by layer and electrical measurement. It is found that the components have obvious surface layer structure; the depth of oxidized surface layer increases with the increase of treatment temperature ( the depth of oxidized surface layer of the samples which were reoxidized at 800~1 000℃ ranges, is from 26 μm to 107 μm); the density of diffused oxygen and the high of the potential barrier of grain in the oxidized surface layer decrease from the surface to the inside.

关 键 词：电子技术 钛酸锶压敏陶瓷 表面氧化层 晶界势垒 二次热处理 SRTIO3 

分 类 号：TM28[一般工业技术—材料科学与工程]