Fe/Cr磁性多层膜的制备及其磁电阻测定  

Fabrication of Fe/Cr multilayers film and the measurement of the magnetoresistance

作　　者：令狐荣锋[1] 梁冰青[2] 周勋[1] 王荫君[2] 

机构地区：[1]贵州师范大学理学院,贵州贵阳550001 [2]中国科学院磁学国家重点实验室,北京100080

出　　处：《物理实验》2005年第6期12-15,共4页Physics Experimentation

摘　　要：利用磁控溅射制备了不同非磁性层厚度的Fe/Cr多层磁性薄膜系统,利用四探针法测定了该多层膜系统在不同磁场下磁电阻效应,用饱和场法给予佐证,溅射制备的多层膜系统饱和场明显地随Cr层厚度增加而衰减振荡,得出了Fe/Cr多层膜的铁磁反铁磁耦合的交换耦合强度随非磁性层厚度变化的物理规律.Fe/Cr multilayer magnetic film system of different nonmagnetic thickness is made by using magnetron sputtering. The four-probe method has been used to measure the magnetoresistance effect of this system in different magnetic fields. The saturation field method is used to give another proof. The saturation field of this system shows varying obviously with the thickness of Cr layer. A physics rule is found out that the coupling intensity varying with nonmagnetic layer thickness of ferromagnetic antiferromagnetic of Fe/Cr.

关 键 词：磁控溅射 四探针法 铁磁-反铁磁耦合 

分 类 号：O441.2[理学—电磁学]