半导体激光器相对强度噪声的实验研究  

Experimental research of relative intensity noise of semiconductor lasers

作　　者：朱晓鹏[1] 甘巧强[1] 任刚[1] 宋国锋[1] 叶晓军[1] 孙永伟[1] 曹青[1] 陈良惠[1] 

机构地区：[1]中国科学院半导体研究所,北京100083

出　　处：《激光技术》2005年第3期241-243,共3页Laser Technology

基　　金：国家八六三计划资助项目(2002AA313060)

摘　　要：建立了一套半导体激光器噪声测量系统用于生产测量和科学研究,其特点是简易,且兼容性大。用该系统对相关的半导体激光器(不同腔长,镀膜与不镀膜等)进行了测量研究,着重研究了镀膜与不镀膜的条件对激光器噪声特性的影响,发现镀膜后管芯一致性提高、受反馈影响增大。为实际生产提供了改进建议,即需要针对实际应用来精心选择端面镀膜的反射率,前端面镀膜反射率不能太低。The goal of this article is to present a measuring sys tem,which is appropriate to industry measuring and science research,for relative intensity noise (RIN) of semiconductor lasers.The advantage of the system is si mple and flexible.The RINs of some semiconductor lasers (with different cavity l ength,with or without coating)were measured.Special attention was paid to the ef fect of coating on the RIN.It is found that the quality stability of the lasers will be improved and the RIN character will be more sensible to feedback with co ating than the lasers without coating.The reflectivity of coating should be chos en carefully according to the real application conditions,and the reflection of the front facet coating should not be too small.

关 键 词：半导体激光器 相对强度噪声 腔长 镀膜 

分 类 号：TN248.4[电子电信—物理电子学]