X射线法测试铍材表层应力沿深度的分布  

Study on Stress in Surface Layer of Beryllium Along Depth Distribution by X-Ray Method

作　　者：董平[1] 

机构地区：[1]表面物理与化学国家重点实验室,四川绵阳621907

出　　处：《原子能科学技术》2005年第B07期156-159,共4页Atomic Energy Science and Technology

基　　金：中国工程物理研究院科学技术基金资助项目(20020867)

摘　　要：X射线应力分析是一种基于X射线衍射原理的无损应力检测方法,应用于铍材时,由于铍的密度低以及对X射线质量吸收系数小,X射线对铍材有较大穿透深度,因此,X射线法可以测试铍材表层一定深度内的应力。由于铍材表层应力分布往往不均匀,常规X射线应力分析法测试铍材应力存在误差,无法得到沿深度的应力分布。本工作根据常规X射线应力分析时不同侧倾角ψ下X射线穿透深度的不同,建立了一种适于铍材表层应力沿深度分布的测试方法,并用悬臂梁加载实验验证了该方法的可行性。X-ray stress analysis is a nondestructive stress measurement method based on the principle of X-ray diffraction. Applied to beryllium, due to its lower density and little mass absorption coefficient, the X-ray penetration depth is rather large. Therefore, the total average stress in the surface layer of beryllium can be measured by X-ray method, but an uneven stress distribution in beryllium usually exists, and there would be some errors when the conventional X-ray stress analysis is adopted, also the stress along depth distribution can not be obtained. According to the difference of the X-ray penetration depth at every tilt during X-ray stress analysis, a new stress measurement method is set up in the paper, which can measure the stress along depth distribution in the surface layer of beryllium. The feasibility of the method has been validated using the cantilever beam loading experiment.

关 键 词：表层应力 X射线法 铍材 X射线应力分析 质量吸收系数 穿透深度 应力分布 应力分析法 检测方法 衍射原理 测试方法 深度分布 加载实验 不均匀 侧倾角 悬臂梁 

分 类 号：TQ171.721[化学工程—玻璃工业] TH133.3[化学工程—硅酸盐工业]