酞菁铜薄膜的折射率及吸收特性  

Refractive Index and Absorption of Copper Phthalocyanine Thin Film

作　　者：陈启婴[1] 顾冬红[1] 干福熹[1] 

机构地区：[1]中国科学院上海光学精密机械研究所

出　　处：《光学学报》1995年第12期1717-1720,共4页Acta Optica Sinica

摘　　要：通过真空镀膜法在单晶硅片上制备了酞菁铜（ＣｕＰｃ）薄膜，在波长扫描和入射角可变全自动椭圆偏振光谱仪上研究了ＣｕＰｃ薄膜的椭偏光谱并分析了其电子结构。A copper phthalocyanine (CuPc) thin film was prefered by vacuum deposition on a single- crystal silicon. The ellipsometric spectra of CuPc thin film have been investigated on a scanning ellipsometer with the analyser and polarizer rotating syllchronously. The spectrum is explained with its energy levels.

关 键 词：酞菁酮 薄膜 椭偏光谱 单晶体 折射率 吸收特性 

分 类 号：O484.41[理学—固体物理]