高分辨双晶XRF测定硫的化学价态  

Chemical Valence States of Sulfur Measured ash a High Resolution Two Crystal X-ray Fluorescence Method

作　　者：王庆广[1] 戴昭华[1] 谢光国[1] 吉昂[1] 马光祖 

机构地区：[1]中国科学院生态环境研究中心,中国科学院上海硅酸盐所,地矿部岩矿测试技术研究所

出　　处：《环境科学》1995年第5期48-50,66,共4页Environmental Science

基　　金：国家自然科学基金

摘　　要：用高分辨双晶ＸＲＦ法测定纯硫、亚硫酸盐、硫酸盐、硫化物等及部分未知样品中硫的比学价态，研究了疏的不同价态的谱峰能量差范围，并根据这个能量差范围判定未知作品中硫的化学价态。单种化学价态的硫标准样在经过ＸＲＦ照射测定后其硫的化学价态基本无变化。各种不同价态硫的谱峰能量差范围为Ｓ’”：＋１．１０至十１．２５（ｅＶ），Ｓ４＋：＋０．６１至＋０．９３（ｅＶ），Ｓ２－：－０．１２至－０．２１（ｅＶ）。本法适用于单种化学态硫样品的分析。With a high resolution two crystal X-ray fluorescence (HRXRF) method, the chemical valencestates of sulfur in pure elemental sulfur, sulfites,sulfates and sulfides and in some of unknownSamples were determined, the range of energydifferences of the spectral peaks for sulfur in different valence states were identified, and then therange of energy differences was used to identifythe chemical valences of sulfur in unknown samples. Each of chemical valence states of sulfur instandard samples had essentially no change afterthey had been subjected to repeated HRXRFmeasurements. Sulfur in various chemical valencestates had the following ranges of energy differences for spectral peaks: S6+, +1. 10 to +1. 25eV;S4+, +0. 61 to + 0. 93 eV; and S2-,-0. 12 to - 0. 21 eV. This method was founduseful in the measurement of sulfur in a singlechemical valence state, and in the identification ofdifferent chemical valence states of sulfur.

关 键 词：硫 化学价态 测定 HRXRF 

分 类 号：X13[环境科学与工程—环境科学] O613.51[理学—无机化学]