单链扫描可测性设计中存储元件的排序  

ORDERING STORAGE ELEMENTS IN SINGLE SCAN TESTABILITY DESIGN

作　　者：叶波[1] 郑增钰[1] 

机构地区：[1]复旦大学专用集成电路与系统国家重点实验室,复旦大学电子工程系

出　　处：《计算机学报》1995年第8期598-603,共6页Chinese Journal of Computers

摘　　要：本文提出了扫描设计中存储元件在扫描链中的最优排序方法．采用文迭测试体制和区间法能快速求出最优解．对于确定的测试向量集，用该方法构造的扫描链能使电路总的测试时间最少．The optimum methodology of ordering the storage elements in single scan testability design is proposed in this paper. Optimum solution can be obtained immediately by using overlapped test scheme and region representation. For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed by this method.

关 键 词：扫描设计 存储元件 时序电路 测试 

分 类 号：TN791.07[电子电信—电路与系统]