新型室温红外探测器的微电容快速测试系统  

Small Capacitance Fast Testing System for Novel Room Temperature Infrared Detector

作　　者：金文贤[1] 徐萍萍[1] 徐晨[1] 沈光地[1] 

机构地区：[1]北京工业大学,北京100022

出　　处：《仪表技术与传感器》2005年第8期39-40,共2页Instrument Technique and Sensor

摘　　要：新型室温红外探测器对8～14μm红外辐射具有快速灵敏的响应,设计出用于该探测器的微电容测试系统,能够快速灵敏地将探测器输出的电容信号通过C-f、f-V变换电路转换为电压信号,然后由A/D转换电路变为数字信号后传到PC机进行信号处理。给出了硬件电路的实现方法,其采样频率为10kHz,电容信号的分辨率为10fF.这种测试方法也适用于其他微小电容式传感器的快速检测。A novel room temperature IR detector is sensitive for 8 - 14μm IR radiation. A measurement system for the IR detector has been developed, by which capacitive signal from the detector can be tested fast and accurately. Via transform circuit of C - f and f - V, so the capacitive signal was transformed voltage signal for smart test. Then the voltage signal were changed to digital signal by A/D convector and transferred to PC for process. The hardware design of the circuit with the sampling frequency of 10 kHz and resolution of 10 fF was obtained. The measurement is useful for fast test of other small capacitive sensor.

关 键 词：微电容 红外探测器 快速检测 电路系统 

分 类 号：TN215[电子电信—物理电子学]