电感耦合等离子体质谱法测定高纯氧化铈中11个稀土杂质的研究  

Determination of Rare Earth Impurities in High Purity Cerium Oxide by Inductively Couple Plasma-Mass Spectrometry

作　　者：刘湘生[1] 柳凤粉[1] 安平[1] 

机构地区：[1]北京有色金属研究总院

出　　处：《光谱实验室》1996年第1期10-13,共4页Chinese Journal of Spectroscopy Laboratory

基　　金：国家"八五"重点科技攻关课题

摘　　要：报道了用电感耦合等离子体质谱法（ＩＣＰ－ＭＳ）测定高纯氧化铈中１１个痕量稀土杂质的方法。分析讨论了氧化铈对测定元素所产生的谱干扰和基体效应，考察了Ｔ１、Ｇａ、Ｃｓ、Ｉｎ等内标补偿基体抑制效应的作用。用此方法测定１１个稀土杂质的检出限为０．０１７－０．４０ｎｇ／ｍＬ，精密度（ＲＳＤ）为２．６％－８．２％。加标回收率为９６．７％－１０７．９％。分析时，不需要预分离和富集，酸溶后可以直接测定。A method for the determination of 11 rare earth impurities in high purity cerium oxide.The method also discussed the spectroscopic interferences and matrix effect,and chose T1,Ga,In,Cs as internal standards to compensate for matrix suppression effect.The determination limits for the individual rare earth element ranged from 0.017 to 0.40ng/mL. The recovery as determined by addition of standard was 96.7%-107.9%,the precision was 2.6% -8.2%(RSD). Neither separation nor preconcentration was needed before the sample was analyzed just following and acid digestion.

关 键 词：质谱 氧化铈 稀土杂质 基体效应 

分 类 号：O614.33[理学—无机化学] O657.6[理学—化学]