提高红外图像均匀性的两级校正技术研究  

Two-level Correction Study for Improvement in Uniformity of IR Images

作　　者：崔洪州[1] 胡劲忠[1] 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《激光与光电子学进展》2005年第9期32-34,38,共4页Laser & Optoelectronics Progress

摘　　要：凝视红外焦平面成像系统中经常需要根据目标红外辐射强度来修改探测器积分时间,当积分时间变化后,红外图像的均匀性明显变差。探索了一种利用积分时间校正与目前实用性较好的两点温度定标法相结合的焦平面非均匀性校正方案,不仅使红外图像的均匀性得到较大幅度提高,而且在修改积分时间的情况下保证图像均匀性不受影响。In staring focal plane array imaging system, integration time of detector is often adjusted according to object＇s intensity of IR radiation. Uniformity of IR image gets worse when integration time varies. A new method of FPA non-uniformity correction, combined integration time correction with two-point temperature correction, which can greatly improve uniformity of IR image and make uniformity of IR image immune to integration time, is presented.

关 键 词：焦平面阵列 非均匀性校正 两点温度定标 积分时间 非均匀性 红外图像 校正技术 红外焦平面 积分时间 两级 红外辐射强度 成像系统 时间变化 

分 类 号：TN215[电子电信—物理电子学] TN957.51