纳米二氧化钛薄膜的制备与结构表征  

PREPARATION AND MICROSTRUCTURE CHARACTERISTICS OF NANO-THIN-FILM TITANIUM OXIDES

作　　者：税必刚[1] 

机构地区：[1]攀枝花钢铁集团公司技术质量部,攀枝花617062

出　　处：《理化检验（物理分册）》2005年第11期562-565,共4页Physical Testing and Chemical Analysis(Part A:Physical Testing)

摘　　要：采用溶胶凝胶法制备均匀透明的TiO2薄膜,利用X衍射对TiO2薄膜进行了相分析,对测定数据使用Warren-Averbach方法计算了微晶尺寸分布,微观应变及由X衍射图谱中TiO2衍射强度得到点阵静畸变描述TiO2微结构特征。用扫描电镜对薄膜表面和断口进行形貌观察。用光电子能谱研究了TiO2薄膜表面的原子组成及结合状态。利用动态接触角研究制备的TiO2薄膜表面浸水行为,表明TiO2既具有较强的亲水性又具有亲油性质,还具有较强的表面活性。This article adoption by the sol-gel process of thin-film titanium oxides, making use of the X-Ray diffraction to analyze mutually of titanium oxides thin film. Calculation the microlite size distribute to the measurement data and the tiny view adapts to changes and the X-Ray diffraction strength is ordered a mutation describes the titanium oxides microstructural characteristic with Warren-Averbach method. The usage scans the electronic microscope to the thin film surface with break proceed the facial look observational. Using the photoelectron can the X-Ray photoelectron Spectrum study the superficial atom constitute and combinative appearance in thin-film titanium oxides. Make use of the dynamic contact angle development get in touch with the cape as to the of microstructure characteristics of thin-film titanium oxides, expressing thin-film titanium oxides since have stronger close the water has the close oil kind again, still having the stronger surface the activity.

关 键 词：TIO2薄膜 X射线衍射 扫描电镜 光电子能谱 动态接触角 结构表征 

分 类 号：O484.5[理学—固体物理]