康普顿散射谱仪的自动控制  

Automation in Compton scattering spectrometer

作　　者：张良平[1] 孔伟[1] 叶邦角[1] 翁惠民[1] 杨保忠[1] 程明福[1] 韩荣典[1] 宫竹芳[1] 

机构地区：[1]中国科学技术大学近代物理系,安徽合肥230026

出　　处：《核电子学与探测技术》2005年第6期828-830,834,共4页Nuclear Electronics & Detection Technology

摘　　要：介绍了利用计算机对由高纯锗探测器、放大器和多道分析器组成的康普顿散射谱仪系统进行自动控制的结构和原理。通过对氧化物、金属、纳米材料等样品的测量,结果显示该系统的长期漂移小于0.05%,不仅提高了测量精度,也节省了测量时间,并且其原理同样也适用于类似的长时间、高精度的放射性测量系统中。This article introduced an auto-controled structure and theory of hardware and software on calibration and data-collection system of Compton scattering spectrometer （ HPGe detector, magnifier and multichannel analyzer ） with PC. By measuring the sample of oxide,metal and nanometric material etc. which has a shift less than 0.05% of the position of peak in long-time measurement. It improves the precision of the measurement, and saves much labor and time as well. These methods can also be used in similar radiation measurement system that needs high precision and long measurement time.

关 键 词：康普顿轮廓 自动控制 标定 

分 类 号：TL817[核科学技术—核技术及应用]