基于Nios红外图像实时非均匀性校正研究  

Correction of infrared image with real-time and nonuniformity based on the nios technique

作　　者：孔令彬[1] 王川[2] 许鸿文[1] 戚建汉[1] 

机构地区：[1]中国地质大学机械与电子工程学院,湖北武汉430074 [2]华中电网有限公司通信处,湖北武汉430077

出　　处：《华中科技大学学报（自然科学版）》2005年第12期70-72,共3页Journal of Huazhong University of Science and Technology(Natural Science Edition)

基　　金：湖北省自然科学基金资助项目(2004BA034)

摘　　要：针对红外成像系统在图像处理中所涉及的数据量大,实时处理难于实现的特点,运用Altera公司SOPC-Nios嵌入式软核心处理器技术,提出一种利用FPGA硬件实现红外焦平面阵列实时非均匀性两点校正的方法.该方法针对非均匀性校正关键的内部循环和耗时算法,创建Nios嵌入式处理器的定制指令,将复杂的顺序指令简化为硬件实现的单指令,用硬件实现校正算法,极大地提高了系统的处理速度和性能,有效地解决了红外成像技术中实时性难题.According to large amounts of image data and difficulties in implementing real-time image processing, a two-point correction method with real-time and non-uniformity was proposed to realize infrared focal plane array（ IRFPA） by the latest SOPC-Nios embedded software core processing technique and field programmable gate array（FPGA）. In consideration of the critical inner loop and time-consuming algorithm in non-uniformity correction, the processing speed of the system and its performance were improved, and the real-time infrared imaging problems were effectively solved through creating custom instructions for Nios embedded processor, and turned the complicated sequential instructions into a single instruction and fulfilling correction algorithm in hardware.

关 键 词：红外焦平面阵列 非均匀性校正 微测辐射热计 现场可编程门阵列 可编程单芯片系统 

分 类 号：TN215[电子电信—物理电子学]